 |
|
| If you can't view the Datasheet, Please click here to try to view without PDF Reader . |
|
|
|
| If you can't view the Datasheet, Please click here to try to view without PDF Reader . |
|
|
| Datasheet File OCR Text: |
| l q qt60160, qt60240 16 and 24 k ey qm atrix ? t ouch s ensor ic s at a glance number of keys: 1 to 16 (qt60160), or 1 to 24 (qt60240) technology: patented spread-spectrum charge-transfer (transverse mode) key outline sizes: 6mm x 6mm or larger (panel thickness dependent); widely different sizes and shapes possible key spacings: 8mm or wider, center to center (panel thickness dependent) electrode design: two-part electrode shapes (drive-receive); wide variety of possible layouts layers required: one layer (with jumpers), two layers (no jumpers) electrode materials: pcb, fpcb, silver or carbon on film, ito on film, orgacon ? ink on film panel materials: plastic, glass, composites, painted surfaces (low particle density metallic paints possible) adjacent metal: compatible with grounded metal immediately next to keys panel thickness: up to 50mm glass, 20mm plastic (key size dependent) key sensitivity: individually settable via simple commands over serial interface interface: i 2 c slave mode (100khz), or parallel output via external shift registers moisture tolerance: best in class. power: 1.8v ~ 5.5v, 40a (16 keys at 1.8v, 2s low power mode). guaranteed to 1.62v. package: 32-pin 5 x 5mm mlf rohs compliant signal processing: self-calibration, auto drift compensation, noise filtering, adjacent key suppression tm applications: mobile phones, remote controls, domestic appliances, pc peripherals, automotive ? orgacon is a registered tra demark of agfa-gevaert n.v l q copyright ? 2006 qrg ltd qt60240-isg r8.06/0906 these devices are designed for low cost mobile and consumer electronics applications. qmatrix? technology employs transverse charge-transfer sensing electrode designs which can be made very compact and are easily wired. charge is forced from an emitting electrode into the overlying panel dielectric, and then collected on a receiver electrode which directs the charge into a sampling capacitor which is then converted directly to digital form without the use of amplifiers. keys are configured in a matrix format that minimizes the number of required scan lines and device pins. the key electrodes can be designed into a conventional printed circuit board (pcb) or flexible printed circuit board (fpcb) as a copper pattern, or as printed conductive ink on plastic film. y2a y1a y0a /rst scl sda smp y2b latch vref s_sync x0 x1 x2 x3 x4 m_sync change vss vdd vss vdd x6 x7 x5 vdd a1 vdd vss a0 y0b y1b 1 2 3 4 5 6 7 817 18 19 20 21 22 23 24 32 31 30 29 28 27 26 25 910 11 16 15 14 13 12 qt60240 qt60160 mlf-32 -40 0 c to +85 0 c 24 qt60240-isg -40 0 c to +85 0 c 16 qt60160-isg t a keys part number available options
13 4.7 setups .............................. 13 4.6 cal all ............................... 13 4.5 raw data commands ....................... 12 4.4 report detections for all keys ................... 12 4.3 reading data from the device .................. 12 4.2 writing data to the device ..................... 12 4.1 introduction ............................ 12 4 control commands ........................ 11 3.4 change pin ........................... 10 3.3 i2c port .............................. 10 3.2 shift register output mode .................... 10 3.1 introduction ............................ 10 3 interfaces .............................. 8 2.16 wiring .............................. 7 2.15 sleep .............................. 7 2.14 detection integrators ....................... 7 2.13 spread spectrum acquisitions .................. 7 2.12 reset input ........................... 7 2.11 startup / calibration times .................... 6 2.10 power supply considerations .................. 6 2.9.3 pcb cleanliness ........................ 6 2.9.2 led traces and other switching signals .............. 6 2.9.1 overview ........................... 6 2.9 pcb layout, construction ..................... 6 2.8 key design ............................ 5 2.7 matrix series resistors ...................... 4 2.6 signal levels ........................... 4 2.5 sample resistors ......................... 4 2.4 sample capacitor saturation ................... 3 2.3 cs sample capacitor operation .................. 3 2.2 burst paring ............................ 3 2.1 matrix scan sequence ....................... 3 2 hardware and functional ..................... 3 1.3 enabling / disabling keys ..................... 3 1.2 part differences .......................... 3 1.1 introduction ............................ 3 1 overview ............................... 25 7.8 moisture sensitivity level (msl) .................. 25 7.7 marking .............................. 25 7.6 mechanical dimensions ...................... 24 7.5 power consumption ........................ 23 7.4 timing specifications ....................... 23 7.3 dc specifications ......................... 23 7.2 recommended operating conditions ............... 23 7.1 absolute maximum electrical specifications ............ 23 7 specifications ........................... 21 6.16 setups block .......................... 20 6.15 drift hold time - dht ...................... 20 6.14 awake timeout - awake .................... 20 6.13 wake on key touch - wake ................... 20 6.12 sleep duration - sleep ..................... 19 6.11 mains sync - msync ...................... 19 6.10 oscilloscope sync - ssync ................... 19 6.9 adjacent key suppression - aks ................. 19 6.8 burst length - bl ......................... 18 6.7 positive recalibration delay - prd ................ 18 6.6 negative recal delay - nrd .................... 18 6.5 detect integrators - ndil, fdil .................. 17 6.4 drift compensation - ndrift, pdrift .............. 17 6.3 positive threshold - pthr .................... 17 6.2 negative threshold - nthr .................... 17 6.1 introduction ............................ 17 6 setups ................................ 16 5.6 combining address and data packets into a transmission .... 15 5.5 data packet format ........................ 15 5.4 address packet format ...................... 15 5.3 start and stop conditions ................... 15 5.2 transferring data bits ....................... 15 5.1 interface bus ........................... 15 5 i2c operation ............................ l q 2 qt60240-isg r8.06/0906 contents 1 overvie w 1.1 introduction qt60xx0 devices are digital burst mode charge-transfer (qt) sensors designed specifically for matrix layout touch controls; they include all signal processing functions necessary to provide stable sensing under a wide variety of changing conditions. only a few external parts are required for operation. the entire circuit can be built within a few square centimeters of single-sided pcb area. cem-1 and fr1 punched, single-sided materials can be used for the lowest possible cost. the pcb?s rear can be mounted flush on the back of a glass or plastic panel using a conventional adhesive, such as 3m vhb two-sided adhesive acrylic film. qt60xx0 devices employ transverse charge-transfer ('qt') sensing, a technology that senses changes in electrical charge forced across two electrode elements by a pulse edge (figure 1.1). qt60xx0 devices allow a wide range of key sizes and shapes to be mixed together in a single touch panel. the devices use an i 2 c interface to allow key data to be extracted and to permit individual key parameter setup. the command structure is designed to minimize the amount of data traffic while maximizing the amount of information conveyed. in addition to normal operating and setup functions the device can also report back actual signal strengths . qmbtn? software for the pc can be used to program the operation of the ic, as well as read back key status and signal levels in real time. 1.2 part differences there are two versions of the device; one is capable of a maximum of 16 keys (qt60160), the other is capable of a maximum of 24 keys (qt60240). these devices are identical in all respects, except for the maximum number of keys specified. the keys can be located anywhere within an electrical grid of 8 x and 3 y scan lines. unused keys are always pared from the burst sequence in order to optimize speed. similarly, in a given part a lesser number of enabled keys will cause any unused acquisition burst timeslots to be pared from the sampling sequence to optimize acquire speed. thus, if only 14 keys are actually enabled, only 14 timeslots are used for scanning. 1.3 enabling / disabling keys the ndil parameter is used to enable and disable keys in the matrix. setting ndil = 0 for a key disables it (section 6.5). at no time can the number of enabled keys exceed the maximum specified for the device (see section 1.2). on the qt60160, only the first 2 y lines (y0, y1) are operational by default. on the qt60160, to use keys located on line y2, one or more of the pre-enabled keys must be disabled simultaneously while enabling the desired new keys. this can be done in one setups block load operation. 2 hardware and functional 2.1 matrix scan sequence the circuit operates by scanning each key sequentially, key by key. key scanning begins with location x=0 / y=0 (key 0). x axis keys are known as rows while y axis keys are referred to as columns although this has no reflection on actual wiring . keys are scanned sequentially by row, for example the sequence x0y0 x1y0 .... x7y0, x0y1, x1y1... etc. keys are also numbered from 0...23. key 0 is located at x0y0. table 2.1 shows the key numbering. 16 17 18 19 20 21 22 23 y2 8 9 10 11 12 13 14 15 y1 key numbers 0 1 2 3 4 5 6 7 y0 x0 x1 x2 x3 x4 x5 x6 x7 table 2.1 key numbers each key is sampled in a burst of acquisition pulses whose length is determined by the setups parameter bl (page 19); this can be set on a per-key basis. a burst is completed entirely before the next key is sampled; at the end of each burst the resulting signal is converted to digital form and processed. the burst length directly impacts key gain; each key can have a unique burst length in order to allow tailoring of key sensitivity on a key-by-key basis. 2.2 burst paring keys that are disabled by setting ndil = 0 (section 6.5, page 18) have their bursts removed from the scan sequence to save scan time. as a consequence, the fewer keys that are used the faster the device can respond. all calibration times are reduced when keys are disabled . 2.3 cs sample capacitor operation cs capacitors absorb charge from the key electrodes on the rising edge of each x pulse. on each falling edge of x, the y matrix line is clamped to ground to allow the electrode and wiring charges to neutralize in preparation for the next pulse. with each x pulse charge accumulates on cs causing a staircase increase in its differential voltage. after the burst completes, the device clamps the y line to ground causing the opposite terminal to go negative. the charge on cs is then measured using an external resistor to ramp the negative terminal upwards until a zero crossing is achieved. the time required to zero cross becomes the measurement result. l q 3 qt60240-isg r8.06/0906 figure 1.1 field flow between x and y elements overlying panel x element y element the cs should be connected as shown in figure 2.7, page 9. the value of these capacitors is not critical but 4.7nf is recommended for most cases. they should be 10 percent x7r ceramics. if the transverse capacitive coupling from x to y is large enough the voltage on a cs capacitor can saturate, destroying gain. in such cases the burst length should be reduced and/or the cs value increased. see section 2.4. if a y line is not used its corresponding cs capacitor may be omitted and the pins left floating. 2.4 sample capacitor saturation cs voltage saturation at a pin ynb is shown in figure 2.1 saturation begins to occur when the voltage at a ynb pin becomes more negative than -0.25v at the end of the burst. this nonlinearity is caused by excessive voltage accumulation on cs inducing conduction in the pin protection diodes. this badly saturated signal destroys key gain and introduces a strong thermal coefficient which can cause 'phantom' detection. the cause of this is either from the burst length being too long, the cs value being too small, or the x-y transfer coupling being too large. solutions include loosening up the key structure interleaving, more separation of the x and y lines on the pcb, increasing cs, and decreasing the burst length. increasing cs will make the part slower; decreasing burst length will make it less sensitive. a better pcb layout and a looser key structure (up to a point) have no negative effects. cs voltages should be observed on an oscilloscope with the matrix layer bonded to the panel material; if the rs side of any cs ramps more negative than -0.25 volts during any burst (not counting overshoot spikes which are probe artifacts), there is a potential saturation problem. figure 2.2 shows a defective waveform similar to that of 2.1, but in this case the distortion is caused by excessive stray capacitance coupling from the y line to ac ground ; for example, from running too near and too far alongside a ground trace, ground plane, or other traces. the excess coupling causes the charge-transfer effect to dissipate a significant portion of the received charge from a key into the stray capacitance. this phenomenon is more subtle; it can be best detected by increasing bl to a high count and watching what the waveform does as it descends towards and below -0.25v. the waveform will appear deceptively straight, but it will slowly start to flatten even before the -0.25v level is reached. a correct waveform is shown in figure 2.3. note that the bottom edge of the bottom trace is substantially straight (ignoring the downward spikes). unlike other qt circuits, the cs capacitor values on qt60xx 0 devices have no effect on conversion gain. however , they do affect conversion time. unused y lines should be left open. 2.5 sample resistors there are three sample resistors (rs) used to perform single-slope adc conversion of the acquired charge on each cs capacitor. these resistors directly control acquisition gain; larger values of rs will proportionately increase signal gain. for most applications rs should be 1m ? . unused y lines do not require an rs resistor. 2.6 signal levels quantum?s qmbtn software makes it is easy to observe the absolute level of signal received by the sensor on each key. the signal values should normally be in the range of 200 to 750 counts with properly designed key shapes and values of rs. however, long adjacent runs of x and y lines can also artificially boost the signal values, and induce signal saturation; this is to be avoided. the x-to-y coupling should come mostly from intra-key electrode coupling, not from stray x-to-y trace coupling. l q 4 qt60240-isg r8.06/0906 figure 2.1 vcs - nonlinear during burst (burst too long, or cs too small, or x-y transcapacitance too large) figure 2.2 vcs - poor gain, nonlinear during burst (excess capacitance from y line to gnd) figure 2.3 vcs - correct x drive ynb figure 2.4 x-drive pulse roll-off and dwell time the dwell time is fixed at ~500ns - see section 2.7 x drive lost charge due to inadequate settling before end of dwell time y gate dwell time x drive ynb x drive ynb qmbtn software is available free of charge on quantum?s website www.qprox.com. the signal swing from the smallest finger touch should preferably exceed 8 counts, with 12 being a reasonable target. the signal threshold setting (nthr) should be set to a value guaranteed to be less than the signal swing caused by the smallest touch. increasing the burst length (bl) parameter will increase the signal strengths as will increasing the sampling resistor (rs) values. 2.7 matrix series resistors the x and y matrix scan lines can use series resistors (referred to as rx and ry respectively) for improved emc performance (figure 2.7, page 9). x drive lines require rx in most cases to reduce edge rates and thus reduce rf emissions. typical values range from 1k ? to 20k ? . y lines need ry to reduce emc susceptibility problems and in some extreme cases, esd. typical y values are about 1k ? . y resistors act to reduce noise susceptibility problems by forming a natural low-pass filter with the cs capacitors. it is essential that the rx and ry resistors and cs capacitors be placed very close to the chip. placing these parts more than a few millimeters away opens the circuit up to high frequency interference problems (above 20mhz) as the trace lengths between the components and the chip start to act as rf antennae. the upper limits of rx and ry are reached when the signal level and hence key sensitivity are clearly reduced. the limits of rx and ry will depend on key geometry and stray capacitance, and thus an oscilloscope is required to determine optimum values of both. dwell time is the duration in which charge coupled from x to y is captured (figure 2.4, page 4). increasing rx values will cause the leading edge of the x pulses to increasingly roll off, causing the loss of captured charge (and hence loss of signal strength) from the keys. the dwell time of these parts is fixed at 500ns. if the x pulses have not settled within 500ns, key gain will be reduced; if this happens, either the stray capacitance on the x line(s) should be reduced (by a layout change, for example by reducing x line exposure to nearby ground planes or traces), or, the rx resistor needs to be reduced in value (or a combination of both approaches). l q 5 qt60240-isg r8.06/0906 figure 2.5 probing x-drive waveforms with a coin figure 2.6 recommended key structure ?t? should ideally be similar to the complete thickness the fields need to penetrate to the touch surface. smaller dimensions will also work but will give less signal strength. if in doubt, make the pattern coarser. the lower figure shows a simpler structure used for compact key layouts, for example for mobile phones. a layout with a common x drive and three receive electrodes is depicted. y1 y0 x0 y2 one way to determine x line settling time is to monitor the fields using a patch of metal foil or a small coin over the key (figure 2.5). only one key along a particular x line needs to be observed, as each of the keys along that x line will be identical. the 500ns dwell time should exceed the observed 95 percent settling of the x-pulse by 25 percent or more. in almost all cases, ry should be set equal to rx, which will ensure that the charge on the y line is fully captured into the cs capacitor. 2.8 key design circuits can be constructed out of a variety of materials including conventional fr-4, flexible printed circuit boards (fpcb), silver silk-screened on pet plastic film, and even inexpensive punched single-sided cem-1 and fr-2. the actual internal pattern style is not as important as the need to achieve regular x and y widths and spacings of sufficient size to cover the desired graphical key area or a little bit more; ~3mm oversize is acceptable in most cases, since the key?s electric fields drop off near the edges anyway. the overall key size can range from 6mm x 6mm up to 100mm x 100mm but these are not hard limits. the keys can be any shape including round, rectangular, square, etc. the internal pattern can be interdigitated as shown in figure 2.6. for small, dense keypads, electrodes such as shown in the lower half of figure 2.6 can be used. where the panels are thin (usually mobile phones have panels under 2mm thick) the electrode density can be quite high. for better surface moisture suppression, the outer perimeter of x should be as wide as possible, and there should be no ground planes near the keys. the variable ?t? in this drawing represents the total thickness of all materials that the keys must penetrate. 2.9 pcb layout, construction 2.9.1 overview it is best to place the chip near the touch keys on the same pcb so as to reduce x and y trace lengths, thereby reducing the chances for emc problems. long conn ection traces act as rf antennae. the y (receive) lines are much more susceptible to noise pickup than the x (drive) lines. even more importantly, all signal related discrete parts (resistors and capacitors) should be very close to the body of the chip. wiring between the chip and the various resistors and capacitors should be as short and direct as possible to suppress noise pickup. ground planes and traces should not be used around the keys and the y lines from the keys. ground areas, traces, and other adjacent signal conductors that act as ac ground (such as vdd and led drive lines etc.) will absorb the received key signals and reduce signal-to-noise ratio (snr) and thus will be counterproductive. ground planes around keys will also make water film effects worse. ground planes, if used, should be placed under or around the qt chip itself and the associated resistors and capacitors in the circuit, under or around the power supply, and back to a connector, but nowhere else. 2.9.2 led traces and other switching signals digital switching signals near the y lines will induce transients into the acquired signals, deteriorating the snr perfomance of the device. such signals should be routed away from the y lines, or the design should be such that these lines are not switched during the course of signal acquisition (bursts). led terminals which are multiplexed or switched into a floating state and which are within or physically very near a key structure (even if on another nearby pcb) should be bypassed to either vss or vdd with at least a 10nf capacitor to suppress capacitive coupling effects which can induce false signal shifts. the bypass capacitor does not need to be next to the led, in fact it can be quite distant. the bypass capacitor is noncritical and can be of any type. led terminals which are constantly connected to vss or vdd do not need further bypassing. 2.9.3 pcb cleanliness all capacitive sensors should be treated as highly sensitive circuits which can be influenced by stray conductive leakage paths. qt devices have a basic resolution in the femtofarad range; in this region, there is no such thing as ?no clean flux?. flux absorbs moisture and becomes conductive between solder joints, causing signal drift and resultant false detections or transient losses of sensitivity or instability. conformal coatings will trap in existing amounts of moisture which will then become highly temperature sensitive. the designer should specify ultrasonic cleaning as part of the manufacturing process, and in cases where a high level of humidity is anticipated, the use of conformal coatings after cleaning to keep out moisture. 2.10 power supply considerations the power supply can range from +1.8v to +5v nominal. the device can tolerate 5mv/s short-term power supply fluctuations. if the power supply fluctuates slowly with temperature, the device will track and compensate for these changes automatically with only minor changes in sensitivity. if the supply voltage drifts or shifts quickly, the drift compensation mechanism will not be able to keep up, causing sensitivity anomalies or false detections. as these devices use the power supply itself as an analog reference, the power should be very clean and come from a separate regulator. a standard inexpensive low dropout (ldo) type regulator should be used that is not also used to power other loads such as leds, relays, or other high current devices. load shifts on the output of the ldo can cause vdd to fluctuate enough to cause false detection or sensitivity shifts. caution: a regulator ic shared with other logic can result in erratic operation and is not advised. a regulator can be shared among two or more qt devices on one board. one such regulator known to work well with qt chips is the s-817 series from seiko instruments (seiko instruments - www.sii-ic.com). l q 6 qt60240-isg r8.06/0906 a single ceramic 0.1uf bypass capacitor, with short traces, should be placed very close to supply pins 3, 4, 5 and 6 of the ic. failure to do so can result in device oscillation, high current consumption, erratic operation etc. pins 18, 20, and 21 do not require bypassing. 2.11 startup / calibration times the devices require initialization times of up t o 20ms. a calibration takes one matrix scan. disabled keys are subtracted from the burst sequence and thus the cal time is shortened. the scan time should be measured on an oscilloscope. 2.12 reset input the /rst pin can be used to reset the device to simulate a power-down cycle, in order to bring the device up into a known state should communications with the device be lost. the pin is active low, and a low pulse lasting at least 10s must be applied to this pin to cause a reset. the reset pin has an internal 30k ? - 60k ? resistor. a 2.2f capacitor plus a diode to vdd can be connected to this pin as a traditional reset circuit, but this is not required. if an external hardware reset is not used, the reset pin may be connected to vdd or left floating . 2.13 spread spectrum acquisitions qt60xx0 devices use spread-spectrum burst modulation. this has the effect of drastically reducing the possibility of emi effects on the sensor keys, while simul taneously spreading rf emissions. this feature is hard-wired into the device and cannot be disabled or modified. spread spectrum is configured as a frequency chirp over a wide range of frequencies for robust operation. 2.14 detection integrators see also section 6.5, page 18. the devices feature a detection integration mechanism, which acts to confirm a detection in a robust fashion. a per-key counter is incremented each time the key has exceeded its threshold and stayed there for a number of acquisitions. when this counter reaches a preset limit the key is finally declared to be touched. for example, if the limit value is 10, then the device has to exceed its threshold and stay there for 10 acquisitions in succession without going below the threshold level, before the key is declared to be touched. if on any acquisition the signal is not seen to exceed the threshold level, the counter is cleared and the process has to start from the beginning. the qt60xx0 uses a two-tier confirmation mechanism having two such counters for each key. these can be thought of as ?inner loop? and ?outer loop? confirmation counters. the ?inner? counter is referred to as the ?fast-di?; this acts to attempt to confirm a detection via rapid successive acquisition bursts, at the expense of delaying the sampling of the next key. each key has its own fast-di counter and limit value; these limits can be changed via the setups block on a per-key basis. the ?outer? counter is referred to as the ?normal-di?; this di counter increments whenever the fast-di counter has reached its limit value. if a fast-di counter failed to reach its terminal count, the corresponding normal-di counter is also reset. the normal-di counter also has a limit value which is settable on a per-key basis. if a normal-di counter reaches its terminal count, the corresponding key is declared to be touched and becomes ?active?. note that the normal-di can only be incremented once per complete keyscan cycle, i .e. more slowly, whereas the fast-di is incremented ?on the spot? without interruption. the net effect of this mechanism is a multiplication of the inner and outer counters and hence a highly noise-resistance sensing method. if the inner limit is set to 5, and the outer to 3, the net effect is 5x3=15 successive threshold crossings to declare a key as active. 2.15 sleep the device will sleep whenever possible to conserve power. periodically, the part will wake automatically, scan the matrix, and return to sleep unless there is activity which demands further attention. the part will always return to sleep automatically once all activity has ceased. the time for which the part will sleep before automatically awakening can be configured. a new communication with the device while it is asleep will cause it to wake up, service the communication and scan the matrix. at least one full matrix scan is always performed after waking up and before returning to sleep. at the end of each matrix scan, the part will return to sleep unless recent activity demands further attention. if there has been recent activity, the part will perform another complete matrix scan and then attempt to sleep once again. this process is repeated indefinitely until the activity stops and the part returns to sleep. key touch activity will prevent the part from sleeping. the part will not sleep if any touch events were detected at any key in the most recent scan of the key matrix. l q 7 qt60240-isg r8.06/0906 2.16 wiring leave open y line connection i y2a 32 leave open y line connection i y1a 31 leave open y line connection i y0a 30 leave open or vdd reset low; has internal 30k - 60k pull-up i /rst 29 - serial interface clock i/o scl 28 - serial interface data i/o sda 27 - sample output. o smp 26 leave open y line connection i y2b 25 leave open y line connection i y1b 24 leave open y line connection i y0b 23 - com port address 0 i a0 22 - supply ground p vss 21 - power, +1.8v to +5v p vdd 20 - com port address 1 i a1 19 - power, +1.8v to +5v p vdd 18 leave open x matrix drive line o x5 17 leave open x matrix drive line o x4 16 leave open x matrix drive line o x3 15 leave open x matrix drive line o x2 14 leave open x matrix drive line o x1 13 leave open x matrix drive line o x0 12 leave open oscilloscope sync o s_sync 11 - ground i vref 10 leave open shift register latch output o latch 9 leave open x matrix drive line o x7 8 leave open x matrix drive line o x6 7 - power, +1.8v to +5v p vdd 6 - supply ground p vss 5 - power, +1.8v to +5v p vdd 4 - supply ground p vss 3 leave open state change notification o change 2 vdd mains sync input i m_sync 1 if unused, connect to... comments i/o function pin table 2.2 pin listing l q 8 qt60240-isg r8.06/0906 ground or power p input and output i/o open drain output od output only, push-pull o input only i figure 2.7 wiring diagram see table 2.2 for further connection information. suggested regulator manufacture rs: ? toko (xc6215 series) ? seiko (s817 series) ? bcdsemi (ap2121 series) l q 9 qt60240-isg r8.06/0906 matrix y scan in matrix x drive latch scl sda vdd rs2 1m rs0 1m *rx2 1k *rx6 1k **ry2 1k **ry0 1k *rx0 1k vunreg +1.8v to +5v vreg 10k vdd **ry1 1k *rx4 1k scope sync mains sync change i2c rs1 1m note: leave yna, ynb unconnected if not used cs1 4.7nf * optional - for emission suppression ** optional - for rf susceptibility improvement *rx3 1k *rx1 1k *rx7 1k qt60240 qt60160 10k cs2 4.7nf 4.7nf cs0 *rx5 1k follow regulator manufacturers recommended values for input and output bypass capacitors; keep output capacitor close to qt60xx0 pins 4 and 6. if not possible, add a 100nf capacitor next to those pins. 3 interfaces 3.1 introduction the qt60xx0 can be configured to communicate either over an i 2 c bus or a shift register type serial peripheral interface (spi). the pins a0, a1 are used to configure the type of interface and the i 2 c address if this mode is used. the modes and i 2 c addresses are available as shown in table 3.1 below. i 2 c address 117 vdd vdd i 2 c address 17 vss vdd i 2 c address 7 vdd vss shift register vss vss interface a0 a1 table 3.1 interface details 3.2 shift register output mode when the option jumpers are both set at vss, the device disables the i 2 c interface and instead generates output suitable for driving a shift register. the shift register data is output at pin 27 (sda). the clock is output at pin 28 (scl). the data is clocked on the positive-going transition of scl. data is transferred from the shift registers to the latched outputs on the positive-going transition of latch. an example shift register connection is shown in figure 3.1. the shift register data is output over the duration of a matrix scan, as each key is being processed, and it is latched at the end of the scan. the overall communication time depends on the matrix scan time. 75us min t sda - scl sda data to scl clock hold time 500ns min t latch latch pulse width 125us min t sch scl high pulse width 500ns min t scl scl low pulse width units legend parameter table 3.2 shift register figure 3.2, page 11 shows a full shift register cycle with keys 3, 10 and 15 activated. key scan represents the time when the chip is measuring signal from each key. scl, sda and latch represent their respective signals from the chip. scl is an active low clock output. sda is the data output; high if the key is in detect and low if it is not. latch pulses low when the data transfer is complete. data output proceeds as soon as the key has been processed. most keys do not get processed during the key scan. if so, these keys are processed and the data is output after the complete key scan. the internal settings of the device in shift register mode are the default factory settings found in table 6.2. this means the device will operate with a burst length of 48 on all keys, and a sleep time of 125ms for example. these settings cannot be changed in this mode. in shift register mode, the change pin is inactive and should be left open. 3.3 i 2 c port these devices use i 2 c communications, in slave mode only. the qt60160/qt60240 will only respond to the correct address match. i 2 c operating parameters are as follows: max data transfer: 100khz address: 7-bit the match address is selected via pins a0 and a1. table 3.1 shows the address selections. the qt60160/qt60240 allows multiple byte transmissions to provide a more efficient communication. this is particularly useful to retrieve several information bytes at once. every time the host retrieves data from the qt60160/qt60240, an internal address pointer is incremented. therefore, the host only needs to write the initial address pointer of interest (the lowest address), followed by read cycles for as many bytes as required. l q 10 qt60240-isg r8.06/0906 figure 3.1 shift register output q0 q2 q3 q4 q5 q6 q7 ds sh_cp st_cp /q7 74hc595 outputs, keys 16 to 23 q0 q2 q3 q4 q5 q6 q7 ds sh_cp st_cp /q7 74hc595 outputs, keys 8 to 15 q0 q2 q3 q4 q5 q6 q7 ds sh_cp st_cp /q7 74hc595 outputs, keys 0 to 7 qt60160/60240 sda scl latch 27 28 9 3.4 change pin pin 2 (change) is an active-high output that can be used to alert the host to key touches or key releases, thus reducing the need for wasteful i 2 c communications. normally, the host can simply not bother to communicate with the device, except when the change pin goes high. change becomes active only when there is a change in key state (either touch or touch release); change goes low again only when the host performs a read from address 1, the detect status register for all keys on y0. change does not self-clear; only an i 2 c read from location 1 will cause it to clear. it is important to read all three key state addresses to ensure the host has a complete picture of which keys have changed. in shift register mode the change pin does not operate and should be left open. every key can be individually configured to wake a host microcontroller upon a touch change; so, a product can wake from sleep when any key state changes, or only when certain desired keys change state. the configuration is set in the setups block (section 6.13) on a key-by-key basis. l q 11 qt60240-isg r8.06/0906 figure 3.2 shift register cycle key 0 key 1 key 2 key 21 key 22 key 23 key scan scl sda latch t sch t scl key 0 key 3 key 4 key 23 t latch t sda-scl 4 control commands 4.1 introduction the devices feature a set of commands which are used for control and status reporting. as well as table 4.1 refer to table 6.1, page 21 for further details. read/write setups - refer to table 5.2 for details 131 to 253 write setups write-unlock. write 0x55 immediately before writing setups 130 write recalibrate all keys. write 0x55 to this address location to recalibrate all the keys 125 read data for keys 0 to 23, in sequence. refer to table 4.3 for details 4 to 123 read detect status for keys 16 to 23, one bit per key 3 read detect status for keys 8 to 15, one bit per key 2 read detect status for keys 0 to 7, one bit per key 1 read reserved 0 access use address table 4.1 memory map poll rate: the host can make use of the change pin output to initiate a communication; this will guarant ee the optimal polling rate. if the host cannot make use of the change pin the poll rate in normal ?run? operation should be no faster than once per matrix scan (see section 7.4, page 23). typically 10 to 20ms is more than fast enough to extract the key status. anything faster will not provide new information and will slow down the chip operation. sending or reading the setup block is an exception, in this case the host can send the data at the maximum possible rate. run poll sequence: in normal run mode the host should limit traffic with a minimalist control structure. the host should just read the three detect status registers (see figure 4.1, page 14). repeated start: using repeated start is not allowed and can cause communication failure. 4.2 writing data to the device the sequence of events required to write data to the device is shown next. sla+w memaddress aa s data a p host to device device to host stop condition p data to be written data target memory address within device memaddress acknowledge bit a slave address plus write bit sla+w start condition s key the host initiates the transfer by sending the start condition, and follows this by sending the slave address of the device together with the write-bit. the device sends an ack. the host then sends the memory address within the device it wishes to write to. the device sends an ack. the host transmits one or more data bytes; each will be acknowledged by the device. if the host sends more than one data byte, they will be written to consecutive memory addresses. the device automatically increments the target memory address after writing each data byte. after writing the last data byte, the host should send the stop condition. the host should not try to write beyond address 255 because the device will not increment the internal memory address beyond this. 4.3 reading data from the device the sequence of events required to read data from the device is shown next. sla+w memaddress aa sssla+ra a p host to device device to host p a / a data 1 data 2 data n not acknowledge bit/indicates last byte transmission /a slave address plus read bit sla+r stop condition p data from device data target memory address within device memaddress acknowledge bit a slave address plus write bit sla+w start condition s key the host initiates the transfer by sending the start condition, and follows this by sending the slave address of the device together with the write-bit. the device sends an ack. the host then sends the memory address within the device it wishes to read from. the device sends an ack. the host must then send a stop and a start condition followed by the slave address again but this time accompanied by the read-bit. the device will return an ack, followed by a data byte. the host must return either an ack or nack. if the host returns an ack, the device will subsequently transmit the data byte from the next address. each time a data byte is transmitted, the device automatically increments the internal address. the device will continue to return data bytes until the host responds with a nack. the host should terminate the transfer by issuing the stop condition. 4.4 report detections for all keys address 1: detect status for keys 0 to 7 address 2: detect status for keys 8 to 15 address 3: detect status for keys 16 to 23 each location indicates all keys in detection, if any, as a bitfield; touched keys report as 1?s, untouched or disabled keys report as 0?s. note: the change pin is cleared on reading address 1. l q 12 qt60240-isg r8.06/0906 table 4.2 bits for key reporting and numbering 16 17 18 19 20 21 22 23 3 8 9 10 11 12 13 14 15 2 0 1 2 3 4 5 6 7 1 0 1 2 3 4 5 6 7 bit number address note: the device should be reset after disabling keys because, if a key was in detect when it was disabled, it could incorrectly report detect. 4.5 raw data commands addresses 4 to 123 allow data to be read for each key. there are a total of 24 keys and 5 bytes of data per key, yielding a total of 120 addresses. these addresses are read-only. the data for the keys is mapped in sequence, starting with key 0 at addresses 4 to 8. the data for key 15 is located at addresses 79 to 83, and that for key 23 is located at addresses 119 to 123. table 4.3 summarizes this. there are five bytes of data for each key. the first two are the key?s 16-bit signal, and the second two are the key?s 16-bit reference. these are followed by the detect integrator count, which is a 4-bit value stored in the lower nibble. in the case of both the signal and reference, the 16-bit values are accessed as two 8-bit bytes, stored lsb first. 4.6 cal all a value of 0x55 must be written to address 125. upon receiving this command the qt60xx0 will recalibrate all of the keys. recalibration will start at the beginning of the next full matrix scan and last for one scan cycle. 4.7 setups the location ?setups write-unlock?, address 130, allows write access to the setups. normally the setups are write-protected; the write-protection is engaged as soon as a read operation is performed at any address. by writing a value of 0x55 to this address, the write-protection is disengaged. this address is located conveniently immediately before the setups so that the write protection may be disengaged and the setups written in a single i 2 c communication sequence. reading this address is undefined. addresses 131 to 252 provide read/write access to the setups. details of different setups can be found in section 6, page 17. when the host is writing a new setup block the values are being recorded into eeprom as they arrive from the host. l q 13 qt60240-isg r8.06/0906 detectcount (lower nibble) 23 123 reference msb 23 122 reference lsb 23 121 signal msb 23 120 signal lsb 23 119 range of values 3 to 22 19 to 118 detectcount (lower nibble) 2 18 reference msb 2 17 reference lsb 2 16 signal msb 2 15 signal lsb 2 14 detectcount (lower nibble) 1 13 reference msb 1 12 reference lsb 1 11 signal msb 1 10 signal lsb 1 9 detectcount (lower nibble) 0 8 reference msb 0 7 reference lsb 0 6 signal msb 0 5 signal lsb 0 4 use key # address table 4.3 key data figure 4.1 power-on or hardware reset flow chart verify setup block recalibrate all send 0x55 to addr 125 read key status registers addr: 1, 2 and 3 recalibrate all send 0x55 to addr 125 host main process key detection(s) / end of detection processing 'change' output set incorrect setup data correct setup block power-on or hardware reset stuck key detected keys ok send correct setup block internal host processes legend comms with qt l q 14 qt60240-isg r8.06/0906 5 i 2 c operation 5.1 interface bus more detailed information about i 2 c is available from www.i2c-bus.org. devices are connected onto the i 2 c bus as shown in figure 5.1. both bus lines are connected to v dd via pull-up resistors. the bus drivers of all i 2 c devices must be open-drain type. this implements a wired-and function which allows any and all devices to drive the bus, one at a time. a low level on the bus is generated when a device outputs a zero. figure 5.1 i 2 c interface bus vcc device 1 device 2 device 3 device n r1 r2 sda scl 4.7s minimum bus free time between a stop and start condition 4s minimum setup time for stop condition 4s minimum hold time start condition 100 khz maximum bus speed (scl) 7-bit address space unit parameter table 5.1 i 2 c bus specifications 5.2 transferring data bits each data bit transferred on the bus is accompanied by a pulse on the clock line. the level of the data line must be stable when the clock line is high; the only exception to this rule is for generating start and stop conditions. figure 5.2 data transfer sda scl data stable data stable data change 5.3 start and stop conditions the host initiates and terminates a data transmission. the transmission is initiated when the host issues a start condition on the bus, and is terminated when the host issues a stop condition. between start and stop conditions, the bus is considered busy. as shown below, start and stop conditions are signaled by changing the level of the sda line when the scl line is high. figure 5.3 start and stop conditions sda scl start stop 5.4 address packet format all address packets are 9 bits long, consisting of 7 address bits, one read/write control bit and an acknowledge bit. if the read/write bit is set, a read operation is performed, otherwise a write operation is performed. when the device recognizes that it is being addressed, it will acknowledge by pulling sda low in the ninth scl (ack) cycle. an address packet consisting of a slave address and a read or a write bit is called sla+r or sla+w, respectively. the most significant bit of the address byte is transmitted first. the address sent by the host must be consistent with that selected with the option jumpers. figure 5.4 address packet format s da scl addr msb addr lsb r/w ack start 12 789 5.5 data packet format all data packets are 9 bits long, consisting of one data byte and an acknowledge bit. during a data transfer, the host generates the clock and the start and stop conditions, while the receiver is responsible for acknowledging the reception. an acknowledge (ack) is signaled by the receiver pulling the sda line low during the ninth scl cycle. if the receiver leaves the sda line high, a nack is signaled. l q 15 qt60240-isg r8.06/0906 5.6 combining address and data packets into a transmission a transmission consists of a start condition, an sla+r/w, one or more data packets and a stop condition. the wired-anding of the scl line is used to implement handshaking between the host and the device. the device extends the scl low period by pulling the scl line low whenever it needs extra time for processing between the data transmissions. figure 5.6 shows a typical data transmission. note that several data bytes can be transmitted between the sla +r/w and the stop. l q 16 qt60240-isg r8.06/0906 figure 5.5 data packet format scl from master sla+r/w 12 789 sda from transmitter aggregate sda data msb data lsb ack data byte sda from receiver stop, or next data byte figure 5.6 packet transmission 12 789 12 789 data msb data lsb ack data byte stop sda scl addr msb addr lsb r/w ack start sla+r/w 6 setups 6.1 introduction the devices calibrate and process all signals using a number of algorithms specifically designed to provide for high survivability in the face of adverse environmental challenges. they provide a large number of processing options which can be user-selected to implement very flexible, robust keypanel solutions. user-defined setups are employed to alter these algorithms to suit each application. these setups are loaded into the device over the i 2 c serial interfaces. the setups are stored in an onboard eeprom array. many setups employ lookup-table value translation. table 6.2, the setups lookup table on page 22 shows all translation values. the default values are the factory defaults. refer to table 6.1 for all setups. 6.2 negative threshold - nthr the negative threshold value is established relative to a key?s signal reference value. the threshold is used to determine key touch when crossed by a negative-going signal swing after having been filtered by the detection integrator. larger absolute values of threshold desensitize keys since the signal must travel farther in order to cross the threshold level. conversely, lower thresholds make keys more sensitive. as cx and cs drift, the reference point drift-compensates for these changes at a user-set table rate; the threshold level is recomputed whenever the reference point moves, and thus it also is drift compen sated. the amount of nthr required depends on the amount of signal swing that occurs when a key is touched. thicker panels or smaller key geometries reduce ?key gain?, i .e. signal swing from touch, thus requiring smaller nthr values to detect touch. the negative threshold is programmed on a per-key basis using the setup process. see table 6.2, page 22. negative hysteresis: nhyst is fixed at 12.5 percent of the negative threshold value and cannot be altered . typical values : 3 to 8 (7 to 12 counts of threshold; 4 is internally added to nthr to generate the threshold). default value: 6 (10 counts of threshold) 6.3 positive threshold - pthr the positive threshold is used to provide a mechanism for recalibration of the reference point when a key's signal moves abruptly to the positive. this condition is not normal, and usually occurs only after a recalibration when an object is touching the key and is subsequently removed. the desire is normally to recover from these events quickly. positive hysteresis: physt is fixed at 12.5 percent of the positive threshold value and cannot be altered. positive threshold levels are all fixed at six counts of signal and cannot be modified. 6.4 drift compensation - ndrift, pdrift signals can drift because of changes in cx and cs over time and temperature. it is crucial that such drift be compensated, else false detections and sensitivity shifts can occur. drift compensation (figure 6.1) is performed by making the reference level track the raw signal at a slow rate, but only while there is no detection in effect. the rate of adjustment must be performed slowly, otherwise legitimate detections could be ignored. the devices drift compensate using a slew-rate limited change to the reference level; the threshold and hysteresis values are slaved to this reference. when a finger is sensed, the signal falls since the human body acts to absorb charge from the cross-coupling between x and y lines. an isolated, untouched foreign object (a coin, or a water film) will cause the signal to rise very slightly due to an enhancement of coupling. this is contrary to the way most capacitive sensors operate. once a finger is sensed, the drift compensation mechanism ceases since the signal is legitimately detecting an object. drift compensati on only works when the signal in question has not crossed the neg ative threshold level. the drift compensation mechanism can be asymmetric; the drift-compensation can be made to occur in one direction faster than it does in the other simply by changing the ndrift and pdrift setup parameters. this can be done on a per-key basis. l q 17 qt60240-isg r8.06/0906 figure 6.1 thresholds and drift compensation threshold signal hysteresis reference output specifically, drift compensation should be set to compensate faster for increasing signals than for decreasing signals. decreasin g signals should not be compensated quickly, since an approaching finger could be compensated for partially or entirely before even touching the touch pad. however, an obstruction over the sense pad, for which the sensor has already made full allowance, could suddenly be removed leaving the sensor with an artificially suppressed reference level and thus become insensitive to touch. in this latter case, the sensor should compensate for the object's removal by raising the reference level relatively quickly. drift compensation and the detection time-outs work together to provide for robust, adaptive sensing. the time-outs provide abrupt changes in reference calibration depending on the duration of the signal 'event'. ndrift typical values: 9 to 11 (2 to 3.3 seconds per count of drift compensation) ndrift default value: 10 (2.5s / count of drift compensation) pdrift typical values: 3 to 5 (0.4 to 0.8 seconds per count of drift compensation; translation via lut, page ) pdrift default value: 4 (0.6s / count of drift compensation) 6.5 detect integrators - ndil, fdil ndil is used to enable or disable keys and to provide signal filtering. to enable a key, its ndil parameter should be nonzero (ie ndil=0 disables a key). see section 2.2. to suppress false detections caused by spurious events like electrical noise, the devices incorporate a 'detection integrator' or di counter mechanism. a per-key counter is incremented each time the key has exceeded its threshold and stayed there for a number of acquisitions in succession, without going below the threshold level. when this counter reaches a preset limit the key is finally declared to be touched. if on any acquisition the signal is not seen to exceed the threshold level, the counter is cleared and the process has to start from the beginning. the di mechanism uses two counters. the first is the ?fast di? counter fdil. when a key?s signal is first noted to be below the negative threshold, the key enters ?fast burst? mode. in this mode the burst is rapidly repeated for up to the specified limit count of the fast di counter. each key has its own counter and its own specified fast-di limit (fdil), which can range from 1 to 15. when fast-burst is entered the qt device locks onto the key and repeats the acquire burst until the fast-di counter reaches fdil, or, the detection fails beforehand. after this the device resumes normal keyscanning and goes on to the next key. the ?normal di? counter counts the number of times the fast-di counter reached its fdil value. the normal di counter can only increment once per complete scan of all keys. only when the normal di counter reaches ndil does the key become formally ?active?. the net effect of this is that the sensor can rapidly lock onto and confirm a detection with many confirmations, while still scanning other keys. the ratio of ?fast? to ?normal? counts is completely user-settable via the setups process. the total number of required confirmations is equal to fdil times ndil. if fdil = 5 and ndil = 2, the total detection confirmations required is 10, even though the device only scanned through all keys only twice. the di is extremely effective at reducing false detections at the expense of slower reaction times. in some applications a slow reaction time is desirable . the di can be used to intentionally slow down touch response in order to require the user to touch longer to operate the key. if fdil = 1, the device functions conventionally . each channel acquires only once in rotation , and the normal detect integrator counter (ndil) operates to confirm a detection. fast-di is in essence not operational. if fdil m 2, then the fast-di counter also operates in addition to the ndil counter. if signal [ nthr: the fast-di counter is incremented towards fdil due to touch. if signal >nthr then the fast-di counter is cleared due to lack of touch. disabling a key: if ndil =0, the key becomes disabled. keys disabled in this way are pared from the burst sequence in order to improve sampling rates and thus response time. see section 2.2, page 3. ndil typical values : 2, 3 ndil default value: 2 fdil typical values : 4 to 6 fdil default value: 5 6.6 negative recal delay - nrd if an object unintentionally contacts a key resulting in a detection for a prolonged interval it is usually desirable to recalibrate the key in order to restore its function , perhaps after a time delay of some seconds. the negative recal delay timer monitors such detections; if a detection event exceeds the timer's setting, the key will be automatically recalibrated. after a recalibration has taken place, the affected key will once again function normally even if it is still being contacted by the foreign object. this feature is set on a per-key basis using the nrd setup parameter. nrd can be disabled by setting it to zero (infinite timeout) in which case the key will never auto-recalibrate during a continuous detection (but the host could still command it). nrd is set using one byte per key, which can range in value from 0...254. nrd above 0 is expressed in 0.5s increments. thus if nrd =120, the timeout value will actually be 60 seconds. 255 is not a legal number to use. nrd typical values: 20 to 60 (10 to 30 seconds) nrd default value: 20 (10 seconds) nrd range: 0..254 ( , 0.5...127s) nrd accuracy: to within 250ms 6.7 positive recalibration delay - prd a recalibration occurs automatically if the signal swings more positive than the positive threshold level. this condition can occur if there is positive drift but insufficient positive drift compensation , or, if the reference moved negative due to a nrd auto-recalibration, and thereafter the signal rapidly returned to normal (positive excursion). l q 18 qt60240-isg r8.06/0906 as an example of the latter, if a foreign object or a finger contacts a key for period longer than the negative recal delay (nrd), the key is by recalibrated to a new lower reference level. then, when the condition causing the negative swing ceases to exist (e.g. the object is removed) the signal suddenly swings positive to its normal reference. it is almost always desirable in these cases to cause the key to recalibrate quickly so as to restore normal touch operation. the time required to do this is governed by prd. in order for this to work, the signal must rise through the positive threshold level pthr continuously for the prd period. after the prd interval has expired and the autorecalibration has taken place, the affected key will once again function normally. prd accuracy: to within 50ms delay: prd is fixed at 200ms for all keys, and cannot be altered. 6.8 burst length - bl the signal gain for each key is controlled by circuit parameters as well as the burst length. the burst length is simply the number of times the charge-transfer (?qt?) process is performed on a given key. each qt process is simply the pulsing of an x line once, with a corresponding y line enabled to capture the resulting charge passed th rough the key?s capacitance cx. qt60xx0 devices use a fixed number of qt cycles which are executed in burst mode. there can be up to 64 qt cycles in a burst, in accordance with the list of permitted values shown in table 6.2, page 22. increasing burst length directly affects key sensitivity. this occurs because the accumulation of charge in the charge integrator is directly linked to the burst length. the burst length of each key can be set indiv idually, allowing for direct digital control over the signal gains of each key individually. apparent touch sensitivity is also controlled by the negative threshold level (nthr). burst length and nthr interact; normally burst lengths should be kept as short as possible to limit rf emissions, but nthr should be kept above 6 to reduce false detections due to external noise. the detection integrator mechanism also helps to prevent false detections. bl typical values: 1, 2 (32, 48 pulses / burst) bl default value: 2 (48 pulses / burst) bl possible values: 0, 1, 2, 3 (16, 32, 48, 64 pulses/burst) 6.9 adjacent key suppression - aks these devices incorporate adjacent key suppression (?aks? - patent pending) that can be selected on a per-key basis. aks permits the suppression of multiple key presses based on relative signal strength. this feature assists in solving the problem of surface moisture which can bridge a key touch to an adjacent key, causing multiple key presses. this feature is also useful for panels with tightly spaced keys, where a fingertip might in advertently activate an adjacent key. aks works for keys that are aks-enabled anywhere in the matrix and is not restricted to physically adjacent keys; the device has no knowledge of which keys are actually physically adjacent. when enabled for a key, adjacent key suppression causes detections on that key to be suppressed if any other aks-enabled key in the panel has a more negative signal deviation from its reference. this feature does not account for varying key gains (burst length) but ignores the actual negative detection threshold setting for the key. if aks-enabled keys in a panel have different sizes, it may be necessary to reduce the gains of larger keys relative to smaller ones to equalize the effects of aks. the signal threshold of the larger keys can be altered to compensate for this without causing problems with key suppression. adjacent key suppression works to augment the natural moisture suppression of narrow gated transfer switches creating a more robust sensing method. aks default value: 0 (off) 6.10 oscilloscope sync - ssync pin 11 (s_sync) can output a positive pulse oscilloscope sync that brackets the burst of a selected key. more than one burst can output a sync pulse as determined by the setups parameter ssync for each key. this feature is invaluable for diagnostics; without it, observing signals clearly on an oscilloscope for a particular burst is very difficult. this function is supported in quantum?s qmbtn pc software. ssync default value: 0 (off) 6.11 mains sync - msync the mains sync feature uses m_sync pin 1. external fields can cause interference leading to false detections or sensitivity shifts. most fields come from ac power sources. rfi noise sources are heavily suppressed by the low impedance nature of the qt circuitry itsel f. noise such as from 50hz or 60hz fields becomes a problem if it is uncorrelated with acquisition signal sampling; uncorrelated noise can cause aliasing effects in the key signals. to suppress this problem the m_sync input allows bursts to synchronize to the noise source. the noise synchronization operating mode is set by parameter msync in setups. the synchronization occurs only at the burst for the lowest numbered enabled key in the matrix. the device waits for the synchronization signal for up to 100ms after the end of a preceding full matrix scan, then when a negative synchronization edge is received, the matrix is scanned in its entirety again. the sync signal drive should be a buffered logic signal, or perhaps a diode-clamped signal, but never a raw ac signal from the mains. the device will synchronize to the falling edge. l q 19 qt60240-isg r8.06/0906 since noise synchronization is highly effective and inexpensive to implement, it is strongly advised to take advantage of it anywhere there is a possibility of encountering low frequency (i.e. 50/60hz) electric fields. quantum?s qmbtn software can show such noise effects on signals, and will hence assist in determining the need to make use of this feature. if the synchronization feature is enabled but no synchronization signal exists, the sensor will continue to operate but with a delay of 100ms before the start of each matrix scan, and hence will have a slow response time. sync default value: 0 (off) sync possible range: 0, 1 (off, on) 6.12 sleep duration - sleep the qt60xx0 is designed to sleep as much as possible to conserve power. periodically, the part wakes automatically, scans the keyboard matrix and then returns to sleep. the length of time the part sleeps before automatically waking up can be configured to one of eight different values, via a look-up table. the look-up table index must be written to the setups (see table 6.2, page 22). note that when a key changes state, the change pin can be made to go active and the device can go into ?fast mode? automatically if the wake feature is enabled on that key (next section). sleep default value: 3 (125ms) sleep range: 0...7 (16ms...2s) 6.13 wake on key touch - wake the device can be configured for full time wake-up from sleep mode when specific keys are touched or released using this feature, in order to improve response time after each key state change. once awake the key will remain awake until the awake function times out (section 6.14). also this feature makes the change pin go active on a key touch or key release (section 3.4). each key has its own wake configuration bit so that any combination of keys can be configured for this function. the time the part will remain awake after any key state change can also be configured in the setup block (awake feature, next section). any key, even one where the wake feature is not enabled, will prolong the time the part remains awake once the part is awake in shift register mode, the wake function is enabled for all keys, however the change pin does not function in this mode. the awake timeout in shift register mode is 2.5s (note default setting of awake parameter in table 6.2). wake default value: 1 (on) wake possible range: 0, 1 (off, on) 6.14 awake timeout - awake after each matrix scan, the part will automatically go to sleep whenever possible to conserve power, unless there has been a key state change on a key with the wake feature enabled (section 6.13), in which case the part will wake up into ?fast mode? which has no sleep states and operates at the fastest possible speed. the awake timeout feature determines how long the device will remain in this mode from the last key state change. subsequent key state changes further prolong the awake interval. in other words, once the part has been awakened by a change on a wake enabled key, the key response time will be fast for as long as the keyboard remains in use. once key activity lapses for a period longer than the awake timeout, the part will return to sleep mode. the awake period can be configured to a value between 100ms and 25.5s, in increments of 100ms. awake default value: 25 (2.5s) awake range: 1...255 (100ms...25.5s) awake timeout accuracy: to within 50ms 6.15 drift hold time - dht drift hold time (dht) is used to restrict drift on all keys while one or more keys are activated. dht defines the length of time the drift is halted after a key detection. this feature is particularly useful in cases of high-density keypads where touching a key or hovering a finger over the keypad would cause untouched keys to drift, and therefore create a sensitivity shift, and ultimately inhibit any touch detection. dht can be configured to a value of between 100ms and 25.5s, in increments of 100ms. setting this parameter to 0 will disable this feature and the drift compensation on any key will not be dependent on the state of other keys. dht default value: 10 (1s) dht range: 0...255 (off, 100ms...25.5s) l q 20 qt60240-isg r8.06/0906 6.16 setups block table 6.1 setups table setups data is sent from the host to the qt using the i 2 c interface. the setups block is memory mapped onto this interface. thus each setup can be accessed by reading/writing the appropriate address. setups can be accessed individually or as a block. before writing to any setup, an unl ock code (value 0x55) must be written to the setups write unlock address (130). refer also to table 6.2, page 22 for further details, and all of section 6. 20 range is in 100ms increments; 0 = disable, 1 = 100ms, default = 1s 10 24 8 0...255 dht drift hold time 1 253 8 20 range is in 100ms increments; 1 = 100ms. default = 2.5s. 0 is illegal to use 25 24 8 1...255 awake awake timeout 1 252 7 20 19 bits 2,1,0 = sleep duration, 8 values via lut, default = 125ms bits 6 = mains sync, negative edge, 1 = enabled, default = off 3 0 24 24 3 1 sleep = 0...7 msync = 0,1 sleep msync sleep duration mains sync 1 251 6 20 19 19 19 bit 3 = wake, 1 - enabled bits 5, 4 = bl, via lut (table 6.2 page 22), default = 48 bit 6 = aks, 1 - enabled bit 7 = scope sync, 1 = enabled 1 2 0 0 1 1 1 1 1 2 1 1 wake = 0,1 bl = 0...3 aks = 0,1 ssync = 0,1 wake bl aks ssync wake on touch burst length aks scope sync 24 227...250 5 18 range is in 0.5 sec increments; 0 = infinite, default = 10s range is {infinite, 0.5...127s}; 255 is illegal to use 20 1 8 0...254 nrd neg recal delay 24 203...226 4 18 lower nibble = normal di limit, values same as operand (0 = disabled burst) for qt60160, only the first 16 locations are set to 2, the last eight are set to 0 upper nibble = fast di limit, values same as operand (0 does not work) 2 5 1 1 4 4 ndil = 0...15 fdil = 0...15 ndil fdil normal di limit fast di limit 24 179...202 3 17 upper nibble = pos drift comp - via lut (table 6.2, page 22) 4 1 4 pdrift = 0...15 pdrift pos drift comp 24 155...178 2 17 17 lower nibble = neg threshold - take operand and add 4 to get value upper nibble = neg drift comp - via lookup table (lut) (table 6.2, page 22) 6 10 1 1 4 4 nthr = 0...15 ndrift = 0...15 nthr ndrift neg thresh neg drift comp 24 131...154 1 page description default value key scope bits valid range symbol parameter bytes address item l q 21 qt60240-isg r8.06/0906 table 6.2 setups lookup table typical values: for most touch applications, use the values shown in the outlined cells. bold text items indicate default settings. the number to send to the qt is the number in the leftmost column (0...15), not numbers from within the table. the qt uses lookup tables to translate the 0.. .15 to the param eters for each function. nrd is an exception: it can range from 0...254 which is translated from 1 = 0.5s to 254 = 127s, in increments of 0.5s, with zero = infinity. 255 is illegal. awake is an exception: it can range from 1...255 which is translated from 1 = 0.1s to 255 = 25.5s , in increments of 0.1s. zero is il legal. dht is an exception: it can range from 0...255 which is translated from 1 = 0.1s to 255 = 25.5s , in increments of 0.1s. zero will disable dht. 15 15 10 10 19 15 14 14 7.5 7.5 18 14 13 13 6 6 17 13 12 12 4.5 4.5 16 12 11 11 3.3 3.3 15 11 10 10 2.5 - 2.5 - 14 10 9 9 2 2 13 9 8 8 1.5 1.5 12 8 2,000 7 7 1.2 1.2 11 7 1,000 6 6 1 1 - 10 - 6 500 - 5 - 5 0.8 0.8 9 5 250 4 4 - 0.6 - 0.6 8 4 -125- 64 3 3 0.4 0.4 7 3 default= 1s default= 2.5s 64 - 48 - default= 10s 2 - 2 - 0.3 0.3 6 2 0.1...25.5s 0.1...25.5s on 32 on on 32 - on - 0.5 .. 127s 1 1 0.2 0.2 5 1 off unused - off - 16 - off - - off - 16 off 0 (infinite) unused key off 0.1 0.1 4 0 global global global global per key per key per key per key per key per key per key per key per key per key (page 20) (page 20) (page 19) (page 20) (page 19) (page 19) (page 19) (page 20) (page 18) (page 18) (page 18) (page 17) (page 17) (page 17) dht secs awake secs msync sleep ms ssync aks bl pulses wake nrd secs fdil counts ndil counts pdrift secs ndrift secs nthr counts parameter index number l q 22 qt60240-isg r8.06/0906 7 specifications 7.1 absolute maximum electrical specifications operating temp ................................................................................... -40 o c to +85 o c storage temp .................................................................................... -55 o c to +125 o c vdd................................................................................................. -0.5 to +5.5v max continuous pin current, any control or drive pin .......................................................... 10ma short circuit duration to ground, any pin ...................................................................... infinite short circuit duration to vdd, any pin ........................................................................ infinite voltage forced onto any pin ............................................................... -0.6v to (vdd + 0.6) volts eeprom setups maximum writes .............................................................. 100,000 write cycles 7.2 recommended operating conditions vdd............................................................................................... +1.8v to 5.25v note: the devices will run at a minimum of 1.62v. supply ripple+noise ........................................................................................ 5mv cx transverse load capacitance per key ................................................................... 2 to 20pf 7.3 dc specifications vdd = 5.0v, cs = 4.7nf, rs = 470k; ta = recommended range, unless otherwise noted k ? 60 internal /rst pullup resistor rrst bits 10 acquisition resolution ar a 1 input leakage current iil v 4.2 high output voltage voh v 0.2 low output voltage vol 1.8v 7.6 mechanical dimensions 7.7 marking 7.8 moisture sensitivity level (msl) l q 25 qt60240-isg r8.06/0906 b c e d e g f a3 a a2 a1 pin 1 symbol minimum nominal maximum a 0.80 0.90 1.00 a1 0.02 0.05 a2 0.65 1.00 a3 b c d 0.18 0.23 0.30 e 0.30 0.40 0.50 f 2.95 3.10 3.25 g 2.95 3.10 3.25 e 0.50 bsc dimensions in millimeters 0.20 ref 5.00 bsc 5.00 bsc 6240 24 qt60240-isg 6160 16 qt60160-isg marking keys mlf part number ipc/jedec j-std-020c 260 o c msl3 specifications peak body temperature msl rating l q copyright ? 2006 qrg ltd. all rights reserved patented and patents pending corporate headquarters 1 mitchell point ensign way, hamble so31 4rf great britain tel: +44 (0)23 8056 5600 fax: +44 (0)23 8045 3939 www.qprox.com north america 651 holiday drive bldg. 5 / 300 pittsburgh, pa 15220 usa tel: 412-391-7367 fax: 412-291-1015 this device is covered under one or more united states and corresponding international patents. qrg patent numbers can be found online at www.qprox.com. numerous further patents are pending, which may apply to this device or the applications thereof. the specifications set out in this document are subject to change without notice. all products sold and services supplied by qr g are subject to our terms and conditions of sale and supply of services which are available online at www.qprox.com and are supplied with every order acknowledgement. qrg trademarks can be found online at www.qprox.com. qrg pr oducts are not suitable for medical (including lifesaving equipment), safety or mission critical applications or other similar purposes. except as expressly set out in qrg's terms and c onditions, no licenses to patents or other intellectual property of qrg (express or implied) are granted by qrg in connection with the sale o f qrg products or provision of qrg services. qrg will not be liable for customer product design and customers are entirely responsibl e for their products and applications which incorporate qrg's products. development team: samuel brunet, dr. tim ingersoll, matthew trend |
Price & Availability of QT60240-ATG
 |
|
|
|
|
All Rights Reserved © IC-ON-LINE 2003 - 2022 |
| [Add Bookmark] [Contact Us] [Link exchange] [Privacy policy] |
|
Mirror Sites : [www.datasheet.hk]
[www.maxim4u.com] [www.ic-on-line.cn]
[www.ic-on-line.com] [www.ic-on-line.net]
[www.alldatasheet.com.cn]
[www.gdcy.com]
[www.gdcy.net] |